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  • RF Dura Low Insertion Loss Wafer Test Probes
  • RF Dura Low Insertion Loss Wafer Test Probes
  • RF Dura Low Insertion Loss Wafer Test Probes
  • RF Dura Low Insertion Loss Wafer Test Probes

    Features:

    • Dura
    • Humilis insertio
    • Damnum Maximum VSWR

    Applicationes:

    • Proin Test

    Probes

    Probes machinae electronicae adhibitae sunt ad mensuras vel probandas signa electrica vel proprietates in circuitibus electronicis. Solent coniungi cum oscilloscopio, multimetro, aliisve instrumentis testium ad colligendas notitias circa ambitum vel componentem mensurari.

    Aaracteres includunt:

    RF 1.Durable probe
    2.Available in quattuor distantias microns 100/150/200/25
    3.DC ad 67 GHz
    4.Insertion damnum minus quam 1.4 dB
    5.VSWR minus quam 1.45dB
    6.Beryllium materia aeris
    7.High current version available (4A)
    8.Light incisum ac certa perficientur
    9.Anti oxidatio nickel stannum probe tip
    10.Custom configurationes praesto
    11.Suitable enim in chip probatio, junctura parametri extractionis, MEMS producti probatio, et in chip antenna probatio proin circuitus integrati.

    Commodum:

    1. Praeclara mensura accurate et repeatability
    2. minimal damnum fecit per brevem exasperat in aluminium pads
    3. Typical resistentia<0.03Ω

    Nonnullae schedulae communes RF exploratae sunt:

    1. RF circuitus test;
    RF speculatoria coniungi possunt cum puncto RF circuitus, amplitudinem, phasem, frequentiam et alios ambitus ambitus aestimare, mensurans amplitudinis et stabilitatis. Potest adhiberi ad potentiam probandam RF amplificandi, spargendi, mixturae, amplificantis et aliorum RF circuitus.
    2. Wireless communicationis ratio test:
    RF specillum adhiberi potest ad explorandas cogitationes communicationis wireless, ut telephoniis gestabilibus, Wi-Fi iter, Bluetooth machinis, etc. Coniungendo RF probe cum antennae machinae portum, parametri tales quae potentiam transmittunt, sensum accipiunt, et frequentiam. declinatio metiri potest ad aestimandam observantiam machinae et systematis debugging et optimizationis duce.
    3. RF antennae test;
    RF Specillum adhiberi potest ad mores antennae et input impedimentum radialem metiendam. Specillum ad antennae structuram tangendo RF, antennae VSWR (ratio undarum voltatio stans), modus radialis, lucrum et alii parametri mensurari possunt ad antennae observantiam aestimandam et perficiendum antennae consilium et optimizationem.
    4. RF signum vigilantia;
    RF probe adhiberi potest ad monitor transmissionis RF significationum in systematis adhibendae. Detegere potest signum attenuationis, impedimenti, reflexionis et aliorum problematum, auxilium invenire et vitia in systemate egritudinis, ac debitam sustentationem et debugging opus dirigere.
    Compatibilitas Electromagnetica (EMC) test:
    RF speculatoria adhiberi possunt ad probationes EMC faciendas ad aestimandas sensibilitatem electronicarum machinarum ad RF impedimentum in ambitu ambiente. Si explorare RF iuxta fabricam ponendo, responsionem machinae metiri potest ad campos externos RF eiusque observantiam EMC aestimandam.

    QualwaveInc. Praebet DC~110GHz rimarum frequentiam altam, quae notas habent vitae longae servitutis, humilis VSWR et humilis iacturae insertionis, et proin probationibus aliis locis aptae sunt.

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    Unius Portus Probes
    Pars Number Frequentia (GHz) Pix (μm) Indicium Size (m) IL (dB Max.) VSWR (Max.) Configurationis Adscendens Styles Connector Potentia (W Max.) Tempus plumbi (hebdomades)
    QSP-26 DC~26 200 30 0.6 1.45 SG 45° 2.92mm - 2~8
    QSP-40 DC~40 100/125/150/250/300/400 30 1 1.6 GS/SG/GSG 45° 2.92mm - 2~8
    QSP-50 DC~50 150 30 0.8 1.4 GSG 45° 2.4mm - 2~8
    QSP-67 DC~67 100/125/150/240/250 30 1.5 1.7 GS/SG/GSG 45° 1.85mm - 2~8
    QSP-110 DC~110 50/75/100/125 30 1.5 2 GS/GSG 45° 1.0mm - 2~8
    Dual Portus Probes
    Pars Number Frequentia (GHz) Pix (μm) Indicium Size (m) IL (dB Max.) VSWR (Max.) Configurationis Adscendens Styles Connector Potentia (W Max.) Tempus plumbi (hebdomades)
    QDP-40 DC~40 125/150/650/800/1000 30 0.65 1.6 SS/GSGSG 45° 2.92mm - 2~8
    QDP-50 DC~50 100/125/150/190 30 0.75 1.45 GSSG 45° 2.4mm - 2~8
    QDP-67 DC~67 100/125/150/200 30 1.2 1.7 SS/GSSG/GSGSG 45° 1.85mm, 1.0mm - 2~8
    Manual Probes
    Pars Number Frequentia (GHz) Pix (μm) Indicium Size (m) IL (dB Max.) VSWR (Max.) Configurationis Adscendens Styles Connector Potentia (W Max.) Tempus plumbi (hebdomades)
    QMP-20 DC~20 700/2300 - 0.5 2 SS/GSSG/GSGSG Cable Mount 2.92mm - 2~8
    QMP-40 DC~40 800 - 0.5 2 GSG Cable Mount 2.92mm - 2~8
    Calibration Substrates
    Pars Number Pix (μm) Configurationis Dielectric Constant Crassitudo Divisio- Tempus plumbi (hebdomades)
    QCS-75-250-GS-SG-A 75-250 GS/SG 9.9 25mil (635μm) 15*20mm 2~8
    QCS-100-GSSG-A 100 GSSG 9.9 25mil (635μm) 15*20mm 2~8
    QCS-100-250-GSG-A 100-250 GSG 9.9 25mil (635μm) 15*20mm 2~8
    QCS-250-500-GSG-A 250-500 GSG 9.9 25mil (635μm) 15*20mm 2~8
    QCS-250-1250-GSG-A 250-1250 GSG 9.9 25mil (635μm) 15*20mm 2~8

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