Features:
- Opulens
- Humilis insertionem
- Damnum Low Vswr
Proin probes sunt electronic cogitationes propter mensuræ vel temptationis electrica annuit vel proprietatibus in electronic circuits. Solent connectuntur Oscilloscope multimeter vel test apparatu colligere notitia circa circiter aut pars mensuratur.
1.Durable Proin Probe
2.Available in quattuor spatia 100/150/200/25 microns
3.DC ad LXVII GHz
4.Isterion damnum minus quam 1.4 DB
5.Vswr minus quam 1.45db
6,berrylium aeris materiales
7.High Current version available (4a)
8.Light incisum et reliable euismod
9.anti oxidatio Nickel Alloy Ferrarent Tip
10.Custom configuration available
11.Suitable enim in chip temptationis, coniunctas parametri extraction, mems uber temptationis, et in chip antennas probatio de Proin integrated circuits
I. Optimum mensuram accurate et repeatability
II. Minimal damnum per brevis scalpit in aluminium pads
III. Typical contactus resistentia<0.03Ω
I. RF Circuit Test:
Millimeter unda probes potest coniungi ad test punctum RF circuitu, per mensuram amplitudine, tempus, frequency et alia parametri signo ad aestimare perficientur et stabilitatem de circuitu. Potest adhiberi ad test RF Power Amplifier, filter, Mixer, Amplifier et Alia RF circuitus.
II. Wireless Communication System Test:
Radio frequency probe can be used to test wireless communication devices, such as mobile phones, Wi-Fi routers, Bluetooth devices, etc. By connecting the mm-wave probe to the antenna port of the device, parameters such as transmit power, receive sensitivity, and frequency deviation can be measured to evaluate the performance of the device and guide system debugging and optimization.
III. RF Antennae Test:
Coaxial probe potest ad metimur radialem characteres de antenna et input impeditance. Tactus RF Probe ad Antenas structuram, Antennarum Vswr (voltage stans undam Ratio), radialis modus, lucrum et alia parametri potest metiri ad aestimandas et perficientur antennae et exequi Antennae consilio et optimization.
IV. M. signum Cras:
RF Probe possunt ad Monitor transfusioni RF annuit in ratio. Potest adhiberi ad deprehendere signum attenuatione, intercessiones, reflexio et alia problems, auxilium invenire et egritudo in systematis, et duce ad debita sustentacionem et debugging opus.
V. Electro compatibility (EMC) Test:
High frequency probat potest praestare EMC probat ad assess sensitivity electronic cogitationes ad RF intercessiones in circuitu elit. Per ponendo per RF probe prope machinam, quod potest metimur in fabrica scriptor responsio ad externum RF agros et aestimare EMC perficientur.
QUALWAVEInc. praebet DC 110GHz High frequency Rimates, quae habent proprietates diu servitium vitae humilis VSWR et humilis insertionem damnum, et microwave test et aliis elit.
Single Portus Rimates | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|
Pars numerus | Frequency (GHz) | Picem (μm) | Tip Size (M) | II (DB MAX.) | VSWR (Max.) | Conformatio | Adscendens Styles | Iungo | Power (W max.) | Duc Tempus (weeks) |
Qsp, XXVI | DC ~ XXVI | CC | 30 | 0.6 | 1.45 | SG | XLV ° | 2.92mm | - | II ~ VIII |
Qsp, 26.5 | DC ~ 26.5 | CL | 30 | 0,7 | 1.2 | Gsg | XLV ° | SMA | - | II ~ VIII |
Qsp-XL | DC ~ XL | 100/125/150/250/300/400 | 30 | 1 | 1.6 | GS / SG / GSG | XLV ° | 2.92mm | - | II ~ VIII |
Qsp-L | DC ~ L | CL | 30 | 0,8 | 1.4 | Gsg | XLV ° | 2.4mm | - | II ~ VIII |
Qsp-LXVII | DC ~ LXVII | 100/125/150/240/250 | 30 | 1.5 | 1.7 | GS / SG / GSG | XLV ° | 1.85mm | - | II ~ VIII |
Qsp-CX | DC ~ CX | 50/75/100/125/150 | 30 | 1.5 | 2 | GS / GSG | XLV ° | 1.0mm | - | II ~ VIII |
Dual Portus Rimates | ||||||||||
Pars numerus | Frequency (GHz) | Picem (μm) | Tip Size (M) | II (DB MAX.) | VSWR (Max.) | Conformatio | Adscendens Styles | Iungo | Power (W max.) | Duc Tempus (weeks) |
QDP-XL | DC ~ XL | 125/150/650/800/1000 | 30 | 0,65 | 1.6 | SS / GSGSG | XLV ° | 2.92mm | - | II ~ VIII |
QDP-L | DC ~ L | 100/125/150/190 | 30 | 0,75 | 1.45 | GSSG | XLV ° | 2.4mm | - | II ~ VIII |
QDP-LXVII | DC ~ LXVII | 100/125/150/200 | 30 | 1.2 | 1.7 | SS / GSSG / GSGSG | XLV ° | 1.85mm, 1.0mm | - | II ~ VIII |
Manual probes | ||||||||||
Pars numerus | Frequency (GHz) | Picem (μm) | Tip Size (M) | II (DB MAX.) | VSWR (Max.) | Conformatio | Adscendens Styles | Iungo | Power (W max.) | Duc Tempus (weeks) |
QMP, XX | DC ~ XX | 700/2300 | - | 0,5 | 2 | SS / GSSG / GSGSG | Cable montem | 2.92mm | - | II ~ VIII |
QMP-XL | DC ~ XL | DCCC | - | 0,5 | 2 | Gsg | Cable montem | 2.92mm | - | II ~ VIII |
Differentiale TDR Rimes | ||||||||||
Pars numerus | Frequency (GHz) | Picem (μm) | Tip Size (M) | II (DB MAX.) | VSWR (Max.) | Conformatio | Adscendens Styles | Iungo | Power (W max.) | Duc Tempus (weeks) |
QDTP-XL | DC ~ XL | 0,5 ~ IV | - | - | - | SS | - | 2.92mm | - | II ~ VIII |
Calibration Substrati | ||||||||||
Pars numerus | Picem (μm) | Conformatio | Dielectric constant | Crassities | DIMISSIO | Duc Tempus (weeks) | ||||
QCS, 75-250-GS, SG-A | 75-250 | GS / SG | 9,9 | 25mil (635μm) | XV * 20mm | II ~ VIII | ||||
QCS-C, GSSG, A | C | GSSG | 9,9 | 25mil (635μm) | XV * 20mm | II ~ VIII | ||||
QCS-100-250-GSG, A | 100-250 | Gsg | 9,9 | 25mil (635μm) | XV * 20mm | II ~ VIII | ||||
QCS, 250-500, GSG, A | 250-500 | Gsg | 9,9 | 25mil (635μm) | XV * 20mm | II ~ VIII | ||||
QCS, 250-1250-GSG, A | 25-1250 | Gsg | 9,9 | 25mil (635μm) | XV * 20mm | II ~ VIII |